• DocumentCode
    2509363
  • Title

    GEWE-RC MOSFET: A solution to CMOS technology for RFIC design based on the concept of intercept point

  • Author

    Chaujar, R. ; Kaur, R. ; Saxena, M. ; Gupta, M. ; Gupta, R.S.

  • Author_Institution
    Dept. of Electron. Sci., Univ. of Delhi, New Delhi
  • fYear
    2008
  • fDate
    21-24 Nov. 2008
  • Firstpage
    661
  • Lastpage
    664
  • Abstract
    In this paper, the linearity performance of Gate Electrode Workfunction Engineered Recessed Channel (GEWE-RC) MOSFET is investigated using ATLAS device simulator, based on the concept of intercept point. Further, the impact of various technological parameter variations, such as gate length (LG), negative junction depth (NJD), screening metal gate workfunction (PhiM2) and substrate doping (NA) on the linearity performance of GEWE-RC MOSFET, has been explored. Simulation results reveal that GEWE-RC MOSFET design exhibits significantly improved linearity characteristics, in comparison to the conventional Recessed Channel (RC) and bulk, based on third-order input intercept power (IIP3) desirable for RF and wireless communication designs.
  • Keywords
    MOSFET; semiconductor doping; work function; ATLAS device simulator; CMOS technology; RFIC design; gate electrode workfunction engineered recessed channel MOSFET; gate length; intercept point; negative junction depth; screening metal gate workfunction; substrate doping; third-order input intercept power; CMOS technology; Degradation; Intermodulation distortion; Linearity; MOSFET circuits; Microwave devices; Microwave technology; Radio frequency; Radiofrequency integrated circuits; Semiconductor devices; ATLAS; GEWE; Intercept Point; Linearity; Recessed Channel MOSFET;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
  • Conference_Location
    Jaipur
  • Print_ISBN
    978-1-4244-2690-4
  • Electronic_ISBN
    978-1-4244-2691-1
  • Type

    conf

  • DOI
    10.1109/AMTA.2008.4762978
  • Filename
    4762978