Extended life interconnect for large solar cell space arrays

Calculations are presented that show that the stress in this interconnect is reduced by a factor of 60 as compared to interconnects that make use of only the intercell spacing for their stress relief loop. The reason is that traditional interconnects use only an intercell spacing of about 0.5 mm to absorb stress. The extended life interconnect positions the stress interconnect member parallel to the gap between the cells. Therefore, the interconnect´s stressed member can be much longer and the stress consequently less. Also presented are the results of mechanically cycling the interconnect.