• DocumentCode
    2510041
  • Title

    Intelligent process diagnosis based on end-of-line electrical test data

  • Author

    Guo, Ruey-Shan ; Tsai, Cheng-Kai ; Lee, Jian-Huei ; Chang, Shi-Chung

  • Author_Institution
    Dept. of Ind. & Bus. Adm., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    1996
  • fDate
    14-16 Oct 1996
  • Firstpage
    347
  • Lastpage
    354
  • Abstract
    The goal of this research is to develop a fuzzy logic-based system for a first-cut end-of-line diagnosis function. Based on measured abnormal electrical test data, the system provides the engineers a list of prioritized causes (process steps) for further investigation. The intelligent diagnosis system consists of three major modules: fuzzy modeling, knowledge base and inference engine. Experienced engineers diagnosis knowledge is captured in the knowledge base using fuzzy logic knowledge representation models. Each major processing step´s fault possibility is calculated in the inference engine. The intelligent diagnosis system has been validated against 23 real fab cases. Results show that version 2.0 of the system identifies the real causes as the top three causes in 20 cases. Our analysis indicates that the inference engine is robust but the knowledge base is insufficient. Improvement strategy has been to periodically update the knowledge base by field engineers based on lessons learned from the case study
  • Keywords
    fuzzy logic; inference mechanisms; knowledge based systems; semiconductor device manufacture; testing; end-of-line electrical test data; fuzzy logic; inference engine; intelligent process diagnosis; knowledge base; semiconductor wafer fab; Data engineering; Electric variables measurement; Engines; Fuzzy logic; Fuzzy systems; Intelligent systems; Knowledge engineering; Knowledge representation; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3642-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1996.559754
  • Filename
    559754