DocumentCode :
2510134
Title :
Saturated Semantics for Reactive Systems
Author :
Bonchi, Filippo ; König, Barbara ; Montanari, Ugo
Author_Institution :
Pisa Univ.
fYear :
0
fDate :
0-0 0
Firstpage :
69
Lastpage :
80
Abstract :
The semantics of process calculi has traditionally been specified by labelled transition systems (LTS), but with the development of name calculi it turned out that reaction rules (i.e., unlabelled transition rules) are often more natural. This leads to the question of how behavioural equivalences (bisimilarity, trace equivalence, etc.) defined for LTS can be transferred to unlabelled transition systems. Recently, in order to answer this question, several proposals have been made with the aim of automatically deriving an LTS from reaction rules in such a way that the resulting equivalences are congruences. Furthermore these equivalences should agree with the standard semantics, whenever one exists. In this paper we propose saturated semantics, based on a weaker notion of observation and orthogonal to all the previous proposals, and we demonstrate the appropriateness of our semantics by means of two examples: logic programming and a subset of the open pi-calculus. Indeed, we prove that our equivalences are congruences and that they coincide with logical equivalence and open bisimilarity respectively, while equivalences studied in previous works are strictly finer
Keywords :
bisimulation equivalence; logic programming; pi calculus; programming language semantics; set theory; behavioural equivalences; congruence equivalence; labelled transition systems; logic programming; logical equivalence; open bisimilarity; open pi-calculus; process calculi; reaction rules; reactive systems; saturated semantics; unlabelled transition systems; Bipartite graph; Chemical sensors; Computer science; Interactive systems; Logic programming; Open systems; Petri nets; Proposals; Subspace constraints; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Logic in Computer Science, 2006 21st Annual IEEE Symposium on
Conference_Location :
Seattle, WA
ISSN :
1043-6871
Print_ISBN :
0-7695-2631-4
Type :
conf
DOI :
10.1109/LICS.2006.46
Filename :
1691218
Link To Document :
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