Title :
Dielectric studies of binary mixtures of Ethanol with 2-Methoxyethanol at microwave frequencies using time domain reflectometry technique
Author :
Kamble, S.P. ; Sonwane, P.T. ; Tidar, A.L. ; Sudke, Y.S. ; Sayyad, S.D. ; Mharolkar, A.P. ; Dharne, G.M. ; Patil, S.S. ; Khirade, P.W. ; Mehrotra, S.C.
Author_Institution :
Dept. of Phys., Dr. B.A.M. Univ., Aurangabad
Abstract :
The dielectric relaxation measurements on binary mixtures of 2-Methoxyethanol, with Ethanol have been carried out for different concentrations at 288 k, 298 k, 308 k, and 318 k using the time domain reflectometry (TDR) over the frequency range from 10 MHz to 20 GHz. The Kirkwood correlation factor and excess dielectric properties were determined and discussed to yield information on the molecular interaction of the systems. The relaxation time is increasing with increasing concentration of Ethanol. The Bruggeman plot shows a deviation from linearity. This deviation was attributed to some sort of molecular interaction which may take place between the 2-Methoxyethanol and Ethanol. The excess static permittivity and excess relaxation time values are negative for system indicating the solute-solvent interaction to exist between 2-methoxyethanol and Ethanol producing a field in such a way that the effective dipole rotation is hindered.
Keywords :
dielectric liquids; dielectric relaxation; liquid mixtures; organic compounds; permittivity; time-domain reflectometry; 2-methoxyethanol; Bruggeman plot; Kirkwood correlation factor; binary mixtures; dielectric relaxation; dipole rotation; ethanol; frequency 10 MHz to 20 GHz; microwave frequencies; molecular interaction; solute-solvent interaction; static permittivity; temperature 288 K; temperature 298 K; temperature 308 K; temperature 318 K; time domain reflectometry; Coaxial components; Dielectrics; Educational institutions; Ethanol; Microwave frequencies; Oscilloscopes; Permittivity; Physics; Reflectometry; Temperature; Bruggeman factor; Dielectric relaxation; kirkwood correlation factor; time domain reflectometry;
Conference_Titel :
Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
Conference_Location :
Jaipur
Print_ISBN :
978-1-4244-2690-4
Electronic_ISBN :
978-1-4244-2691-1
DOI :
10.1109/AMTA.2008.4763017