Title :
Numerical study of electromagnetic diffusion effect due to imperfect electrical contact
Author :
Bok-ki Kim ; Kuo-Ta Hsieh ; Bostick, F.X.
Author_Institution :
Univ. of Texas at Austin
Keywords :
Bars; Conductors; Contacts; Electromagnetic launching; Electromechanical systems; Microscopy; Power system modeling;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742367
