DocumentCode
2510319
Title
Noise investigation of Terahertz photoconductive emitters
Author
Hou, L. ; Shi, W. ; Chen, S. ; Du, Y. ; Chen, Y.
Author_Institution
Dept. of Appl. Phys., Xian Univ. of Technol., Xian, China
fYear
2012
fDate
23-28 Sept. 2012
Firstpage
1
Lastpage
2
Abstract
The electromagnetic noise generated by terahertz photoconductive emitters was investigated, and the intensity of noise spectrum was analysed by statistical method. The relationship between the noise of the emitter and the resistivity as well as carrier lifetime of the antenna material was obtained. And the effect of carrier lifetime and mobility of antennas on the THz generation efficiency was investigated.
Keywords
antennas; carrier lifetime; electrical resistivity; noise; photoconducting devices; statistical analysis; terahertz wave devices; terahertz wave generation; THz generation efficiency; antenna material; antenna mobility; carrier lifetime; electromagnetic noise; noise spectrum intensity; statistical method; terahertz photoconductive emitters; Antennas; Charge carrier lifetime; Noise; Resistance; Silicon; Thermal noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2012 37th International Conference on
Conference_Location
Wollongong, NSW
ISSN
2162-2027
Print_ISBN
978-1-4673-1598-2
Electronic_ISBN
2162-2027
Type
conf
DOI
10.1109/IRMMW-THz.2012.6380254
Filename
6380254
Link To Document