DocumentCode :
2510550
Title :
Anomaly Detection for Longwave FLIR Imagery Using Kernel Wavelet-RX
Author :
Mehmood, Asif ; Nasrabadi, Nasser M.
Author_Institution :
US Army Res. Lab., Adelphi, MD, USA
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
1385
Lastpage :
1388
Abstract :
This paper describes a new kernel wavelet-based anomaly detection technique for long-wave (LW) Forward Looking Infrared (FLIR) imagery. The proposed approach called kernel wavelet-RX algorithm is essentially an extension of the wavelet-RX algorithm (combination of wavelet transform and RX anomaly detector) to a high dimensional feature space (possibly infinite) via a certain nonlinear mapping function of the input data. The wavelet-RX algorithm in this high dimensional feature space can easily be implemented in terms of kernels that implicitly compute dot products in the feature space (kernelizing the wavelet-RX algorithm). In our kernel wavelet-RX algorithm, a 2-D wavelet transform is first applied to decompose the input image into uniform subbands. A number of significant subbands (high energy subbands) are concatenated together to form a subband-image cube. The kernel RX algorithm is then applied to these subband-image cubes obtained from wavelet decomposition of the LW database images. Experimental results are presented for the proposed kernel wavelet-RX, wavelet-RX and the classical CFAR algorithm for detecting anomalies (targets) in a large database of LW imagery. The ROC plots show that the proposed kernel wavelet-RX algorithm outperforms the wavelet-RX as well as the classical CFAR detector.
Keywords :
infrared imaging; object detection; wavelet transforms; 2D wavelet transform; RX anomaly detector; anomaly detection; high dimensional feature space; kernel wavelet-RX algorithm; long-wave forward looking infrared imagery; longwave FLIR imagery; nonlinear mapping function; wavelet decomposition; Algorithm design and analysis; Clutter; Databases; Detectors; Kernel; Pixel; Wavelet transforms; Classification; Feature extraction; Object detection and recognition; Pattern recognition systems and applications; and analysis; and ranking; reduction; regression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.342
Filename :
5597564
Link To Document :
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