DocumentCode :
2510569
Title :
Simulation Study on an Ultra-High Resolution SPECT with CdTe Detectors
Author :
Ogawa, Koichi ; Muraishi, Masaaki
Author_Institution :
Dept. of Electron. Informatics, Hosei Univ., Tokyo
Volume :
4
fYear :
2006
fDate :
Oct. 29 2006-Nov. 1 2006
Firstpage :
2421
Lastpage :
2425
Abstract :
The development of semiconductor detectors such as CdTe and CdZnTe which work at room temperature enables us to realize a new SPECT system. These semiconductor detectors have a high energy resolution. Moreover, they are used as pixelated detectors, and so the intrinsic resolution can be equal to the pixel size used for measurement. The size of a detector pixel is as small as 1 mm, so that the spatial resolution of a reconstructed SPECT image can establish less than 3mm FWHM. To clarify the feasibility of an ultra-high resolution SPECT system, we conducted some simulations and evaluated the image quality.
Keywords :
II-VI semiconductors; cadmium compounds; semiconductor counters; single photon emission computed tomography; tellurium compounds; CdTe; SPECT; semiconductor detectors; single photon emission computed tomography; Charge carrier processes; Collimators; Costs; Energy resolution; Nuclear and plasma sciences; Scintillation counters; Single photon emission computed tomography; Solid scintillation detectors; Spatial resolution; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
ISSN :
1095-7863
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2006.354401
Filename :
4179515
Link To Document :
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