Proposed acceptance, qualification, and characterization tests for thin-film PV modules

Author

Waddington, D. ; Mrig, L. ; DeBlasio, R. ; Ross, R.

Author_Institution

Solar Energy Res. Inst., Golden, CO, USA

fYear

1988

fDate

1988

Firstpage

1236

Abstract

Details of a proposed test program for PV thin-film modules which the Department of Energy has directed SERI to prepare are presented. Results of one of the characterization tests that SERI has performed are also presented. The objective is to establish a common approach to testing modules that will be acceptable to both users and manufacturers. The tests include acceptance, qualification, and characterization tests. Acceptance tests verify that randomly selected modules have similar characteristics. Qualification tests are based on accelerated test methods designed to simulate adverse conditions. Characterization tests provide data on performance in a predefined environment.

Keywords

semiconductor device testing; solar cells; standards; USA; acceptance; characterization; performance; qualification; semiconductor device testing; solar cells; test program; thin-film PV modules; Design methodology; Life estimation; Logic testing; Manufacturing; Materials testing; Performance evaluation; Production; Qualifications; Stability; Stress; System testing; Temperature; Testing; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE

Conference_Location

Las Vegas, NV, USA

Type

conf

DOI

10.1109/PVSC.1988.105902

Filename

105902