DocumentCode
2510684
Title
Development and analysis of noble-metal wire interconnections on Au thick film using parallel gap welding technique for MEMS and microsystems
Author
Sharma, R.P. ; Khanna, P.K. ; Kumar, D. ; Kumar, S. ; Pandey, H.C.
Author_Institution
Dept. of Electron. Sci., Kurukshetra Univ., Kurukshetra
fYear
2008
fDate
21-24 Nov. 2008
Firstpage
739
Lastpage
741
Abstract
Many engineering applications, particularly that of electronic packaging interconnect design, require reduced feature size and use of heat stable materials. Parallel gap welding is an attractive joining method for the formation of thermally and mechanically stable Pb-free bonds in electronic and electrical devices. This type of welding is useful in producing strong interconnections on thick-film pads on ceramic substrates. A solid phase-thermo compression type bond is formed using parallel gap resistance welder. The service temperature of these joints is much higher than their fabrication temperature depending upon the material system involved. This study is focused at noble metal wire welding on thick gold film using parallel gap welding technique. Screen printed gold thick films are prepared on ceramic substrate. Interconnections are prepared with variable operations including voltage and pulse duration; electrode type, size and gap; and force on the weld head. Surface impression of thick film and at joint for different parameter settings of the welder are analyzed and optimized. This joining technique is very useful in MEMS packaging and gas sensor micro-hot plate connections where high temperature stable joints are required.
Keywords
electric welding; electronics packaging; gold; interconnections; micromechanical devices; thick films; welding electrodes; Au; MEMS packaging; ceramic substrate; microsystem interconnections; noble-metal wire interconnection; parallel gap welding; screen printed gold thick film; surface impression; welding electrode; Ceramics; Design engineering; Electronics packaging; Gold; Micromechanical devices; Substrates; Temperature dependence; Thick films; Welding; Wire; electrode; noble metal; parallel gap welding; peel test; thick film;
fLanguage
English
Publisher
ieee
Conference_Titel
Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
Conference_Location
Jaipur
Print_ISBN
978-1-4244-2690-4
Electronic_ISBN
978-1-4244-2691-1
Type
conf
DOI
10.1109/AMTA.2008.4763044
Filename
4763044
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