• DocumentCode
    2510684
  • Title

    Development and analysis of noble-metal wire interconnections on Au thick film using parallel gap welding technique for MEMS and microsystems

  • Author

    Sharma, R.P. ; Khanna, P.K. ; Kumar, D. ; Kumar, S. ; Pandey, H.C.

  • Author_Institution
    Dept. of Electron. Sci., Kurukshetra Univ., Kurukshetra
  • fYear
    2008
  • fDate
    21-24 Nov. 2008
  • Firstpage
    739
  • Lastpage
    741
  • Abstract
    Many engineering applications, particularly that of electronic packaging interconnect design, require reduced feature size and use of heat stable materials. Parallel gap welding is an attractive joining method for the formation of thermally and mechanically stable Pb-free bonds in electronic and electrical devices. This type of welding is useful in producing strong interconnections on thick-film pads on ceramic substrates. A solid phase-thermo compression type bond is formed using parallel gap resistance welder. The service temperature of these joints is much higher than their fabrication temperature depending upon the material system involved. This study is focused at noble metal wire welding on thick gold film using parallel gap welding technique. Screen printed gold thick films are prepared on ceramic substrate. Interconnections are prepared with variable operations including voltage and pulse duration; electrode type, size and gap; and force on the weld head. Surface impression of thick film and at joint for different parameter settings of the welder are analyzed and optimized. This joining technique is very useful in MEMS packaging and gas sensor micro-hot plate connections where high temperature stable joints are required.
  • Keywords
    electric welding; electronics packaging; gold; interconnections; micromechanical devices; thick films; welding electrodes; Au; MEMS packaging; ceramic substrate; microsystem interconnections; noble-metal wire interconnection; parallel gap welding; screen printed gold thick film; surface impression; welding electrode; Ceramics; Design engineering; Electronics packaging; Gold; Micromechanical devices; Substrates; Temperature dependence; Thick films; Welding; Wire; electrode; noble metal; parallel gap welding; peel test; thick film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
  • Conference_Location
    Jaipur
  • Print_ISBN
    978-1-4244-2690-4
  • Electronic_ISBN
    978-1-4244-2691-1
  • Type

    conf

  • DOI
    10.1109/AMTA.2008.4763044
  • Filename
    4763044