DocumentCode :
2510730
Title :
Measurements and Analysis of Cryogenic Sapphire Dielectric Resonators and DRO´s
Author :
Dick, G.J. ; Strayer, D.M.
fYear :
1987
fDate :
27-29 May 1987
Firstpage :
487
Lastpage :
491
Keywords :
Cryogenics; Dielectric losses; Dielectric measurements; Frequency measurement; Kelvin; Length measurement; Microwave oscillators; Optical resonators; Optical ring resonators; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
41st Annual Symposium on Frequency Control. 1987
Conference_Location :
Philadelphia, Pennsylvania, USA
Type :
conf
DOI :
10.1109/FREQ.1987.201066
Filename :
1538006
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2510730
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