DocumentCode
2511328
Title
Genetic-Based Type II Feature Extraction for Periocular Biometric Recognition: Less is More
Author
Adams, Joshua ; Woodard, Damon L. ; Dozier, Gerry ; Miller, Philip ; Bryant, Kelvin ; Glenn, George
Author_Institution
Dept. of Comput. Sci., North Carolina A&T State Univ., Greensboro, NC, USA
fYear
2010
fDate
23-26 Aug. 2010
Firstpage
205
Lastpage
208
Abstract
Given an image from a biometric sensor, it is important for the feature extraction module to extract an original set of features that can be used for identity recognition. This form of feature extraction has been referred to as Type I feature extraction. For some biometric systems, Type I feature extraction is used exclusively. However, a second form of feature extraction does exist and is concerned with optimizing/minimizing the original feature set given by a Type I feature extraction method. This second form of feature extraction has been referred to as Type II feature extraction (feature selection). In this paper, we present a genetic-based Type II feature extraction system, referred to as GEFE (Genetic & Evolutionary Feature Extraction), for optimizing the feature sets returned by Loocal Binary Pattern Type I feature extraction for periocular biometric recognition. Our results show that not only does GEFE dramatically reduce the number of features needed but the evolved features sets also have higher recognition rates.
Keywords
biometrics (access control); feature extraction; genetic algorithms; image recognition; biometric sensor; evolutionary feature extraction; feature selection; genetic feature extraction; genetic-based type II feature extraction; identity recognition; local binary pattern; periocular biometric recognition; type I feature extraction; Accuracy; Databases; Feature extraction; Histograms; Pattern recognition; Pixel; Probes; Periocular Biometrics; Steady-state Genetic Algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location
Istanbul
ISSN
1051-4651
Print_ISBN
978-1-4244-7542-1
Type
conf
DOI
10.1109/ICPR.2010.59
Filename
5597604
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