• DocumentCode
    2511328
  • Title

    Genetic-Based Type II Feature Extraction for Periocular Biometric Recognition: Less is More

  • Author

    Adams, Joshua ; Woodard, Damon L. ; Dozier, Gerry ; Miller, Philip ; Bryant, Kelvin ; Glenn, George

  • Author_Institution
    Dept. of Comput. Sci., North Carolina A&T State Univ., Greensboro, NC, USA
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    205
  • Lastpage
    208
  • Abstract
    Given an image from a biometric sensor, it is important for the feature extraction module to extract an original set of features that can be used for identity recognition. This form of feature extraction has been referred to as Type I feature extraction. For some biometric systems, Type I feature extraction is used exclusively. However, a second form of feature extraction does exist and is concerned with optimizing/minimizing the original feature set given by a Type I feature extraction method. This second form of feature extraction has been referred to as Type II feature extraction (feature selection). In this paper, we present a genetic-based Type II feature extraction system, referred to as GEFE (Genetic & Evolutionary Feature Extraction), for optimizing the feature sets returned by Loocal Binary Pattern Type I feature extraction for periocular biometric recognition. Our results show that not only does GEFE dramatically reduce the number of features needed but the evolved features sets also have higher recognition rates.
  • Keywords
    biometrics (access control); feature extraction; genetic algorithms; image recognition; biometric sensor; evolutionary feature extraction; feature selection; genetic feature extraction; genetic-based type II feature extraction; identity recognition; local binary pattern; periocular biometric recognition; type I feature extraction; Accuracy; Databases; Feature extraction; Histograms; Pattern recognition; Pixel; Probes; Periocular Biometrics; Steady-state Genetic Algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.59
  • Filename
    5597604