DocumentCode :
2511349
Title :
Asymmetric Multilayered Gate Dielectric (AMGAD) surrounding gate MOSFET: A new structural concept for enhanced device performance
Author :
Kaur, H. ; Kabra, S. ; Haldar, S. ; Gupta, R.S.
Author_Institution :
Dept. of Electron. Sci., Univ. Of Delhi, New Delhi
fYear :
2008
fDate :
21-24 Nov. 2008
Firstpage :
764
Lastpage :
767
Abstract :
A two-dimensional analytical model for asymmetric multilayered gate dielectric surrounding gate MOSFET (AMGAD SGT) is presented and its effectiveness in suppressing short channel effects and hot carrier effects is examined. The expressions for potential and electric field have been obtained and the analysis is extended to obtain the threshold voltage and subthreshold slope of the device. It has been established that incorporation of asymmetric multilayered gate dielectric design leads to enhanced carrier transport efficiency besides also improving the short channel immunity and hot carrier reliability. The model is verified by comparing the analytical results with the simulated data obtained from device simulator ATLAS and a good agreement is found.
Keywords :
MOSFET; semiconductor device models; asymmetric multilayered gate dielectric-surrounding gate MOSFET; carrier transport efficiency; device simulator ATLAS; hot carrier effects; short channel effects; two-dimensional analytical model; Analytical models; CMOS technology; Controllability; Dielectric devices; High K dielectric materials; High-K gate dielectrics; Hot carriers; MOSFET circuits; Semiconductor films; Silicon; ATLAS; Asymmetric Multilayered Gate Dielectric; Device modeling; Short channel effects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
Conference_Location :
Jaipur
Print_ISBN :
978-1-4244-2690-4
Electronic_ISBN :
978-1-4244-2691-1
Type :
conf
DOI :
10.1109/AMTA.2008.4763075
Filename :
4763075
Link To Document :
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