DocumentCode :
2511442
Title :
Wavelet-Based Texture Retrieval Modeling the Magnitudes of Wavelet Detail Coefficients with a Generalized Gamma Distribution
Author :
de Ves, Esther ; Benavent, X. ; Ruedin, A. ; Acevedo, D. ; Seijas, L.
Author_Institution :
Depto. de Inf.-Inst. de Robot., Univ. de Valencia, Valencia, Spain
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
221
Lastpage :
224
Abstract :
This paper presents a texture descriptor based on the fine detail coefficients at three resolution levels of a traslation invariant undecimated wavelet transform. First, we consider vertical and horizontal wavelet detail coefficients at the same position as the components of a bivariate random vector, and the magnitude and angle of these vectors are computed. The magnitudes are modeled by a Generalized Gamma distribution. Their parameters, together with the circular histograms of angles, are used to characterize each texture image of the database. The Kullback-Leibler divergence is used as the similarity measurement. Retrieval experiments, in which we compare two wavelet transforms, are carried out on the Brodatz texture collection. Results reveal the good performance of this wavelet-based texture descriptor obtained via the Generalized Gamma distribution.
Keywords :
gamma distribution; image retrieval; image texture; random processes; wavelet transforms; Brodatz texture collection; Kullback-Leibler divergence; bivariate random vector; fine detail coefficients; generalized Gamma distribution; horizontal wavelet detail coefficients; retrieval experiments; similarity measurement; texture image; traslation invariant undecimated wavelet transform; vertical wavelet detail coefficients; wavelet-based texture descriptor; wavelet-based texture retrieval modeling; Computational modeling; Databases; Feature extraction; Histograms; Image resolution; Wavelet transforms; Content-based Image Retrieval; Generalized Gamma Distribution; Wavelet Texture Descriptor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.63
Filename :
5597608
Link To Document :
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