• DocumentCode
    2511464
  • Title

    Determination of the Copper Layer Thickness in Spin Valves by Grazing Incidence X-Ray Fluorescence

  • Author

    Hase, T.P.A. ; Tanner, B.K. ; Marrows, C.H. ; Hickey, Brian J.

  • Author_Institution
    Univ. of Durham
  • fYear
    1998
  • fDate
    6-9 Jan. 1998
  • Firstpage
    282
  • Lastpage
    282
  • Keywords
    Atomic layer deposition; Atomic measurements; Copper; Extraterrestrial measurements; Fluorescence; Magnetic multilayers; Reflectivity; Spin valves; Thickness measurement; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-5118-5
  • Type

    conf

  • DOI
    10.1109/INTMAG.1998.742420
  • Filename
    742420