DocumentCode :
2511464
Title :
Determination of the Copper Layer Thickness in Spin Valves by Grazing Incidence X-Ray Fluorescence
Author :
Hase, T.P.A. ; Tanner, B.K. ; Marrows, C.H. ; Hickey, Brian J.
Author_Institution :
Univ. of Durham
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
282
Lastpage :
282
Keywords :
Atomic layer deposition; Atomic measurements; Copper; Extraterrestrial measurements; Fluorescence; Magnetic multilayers; Reflectivity; Spin valves; Thickness measurement; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.742420
Filename :
742420
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2511464
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