Title :
Determination of the Copper Layer Thickness in Spin Valves by Grazing Incidence X-Ray Fluorescence
Author :
Hase, T.P.A. ; Tanner, B.K. ; Marrows, C.H. ; Hickey, Brian J.
Author_Institution :
Univ. of Durham
Keywords :
Atomic layer deposition; Atomic measurements; Copper; Extraterrestrial measurements; Fluorescence; Magnetic multilayers; Reflectivity; Spin valves; Thickness measurement; X-ray scattering;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742420