• DocumentCode
    2511727
  • Title

    At-speed built-in self-repair analyzer for embedded word-oriented memories

  • Author

    Du, Xiaogang ; Reddy, Sudhakar M. ; Cheng, Wu-Tung ; Rayhawk, Joseph ; Mukherjee, Nilanjan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    895
  • Lastpage
    900
  • Abstract
    CRESTA is a built-in self-repair analyzer (BISRA) used for repair of bit-oriented memories, which can repair all repairable bit-oriented memories with available spare resource. This paper enhances CRESTA to support embedded word-oriented memories. Within each read cycle of at-speed memory BIST, the analyzer is able to handle multiple-bit failure in a word-oriented memory. Furthermore, to reduce area overhead, the proposed analyzer is reconfigurable to process all repair strategies in serial. To cover all repair strategies efficiently, we propose a branch and bound algorithm to select repair strategies.
  • Keywords
    built-in self test; embedded systems; failure analysis; memory architecture; BIST; bit oriented memories; builtin self repair analyzer; builtin self test; comprehensive real time exhaustive search test and analysis; embedded word oriented memories; memory architecture; multiple bit failure; read cycle; Automatic testing; Built-in self-test; Engines; Failure analysis; Fault detection; Logic; Pipelines; Pulp manufacturing; Redundancy; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2004. Proceedings. 17th International Conference on
  • Print_ISBN
    0-7695-2072-3
  • Type

    conf

  • DOI
    10.1109/ICVD.2004.1261044
  • Filename
    1261044