Title :
At-speed built-in self-repair analyzer for embedded word-oriented memories
Author :
Du, Xiaogang ; Reddy, Sudhakar M. ; Cheng, Wu-Tung ; Rayhawk, Joseph ; Mukherjee, Nilanjan
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
CRESTA is a built-in self-repair analyzer (BISRA) used for repair of bit-oriented memories, which can repair all repairable bit-oriented memories with available spare resource. This paper enhances CRESTA to support embedded word-oriented memories. Within each read cycle of at-speed memory BIST, the analyzer is able to handle multiple-bit failure in a word-oriented memory. Furthermore, to reduce area overhead, the proposed analyzer is reconfigurable to process all repair strategies in serial. To cover all repair strategies efficiently, we propose a branch and bound algorithm to select repair strategies.
Keywords :
built-in self test; embedded systems; failure analysis; memory architecture; BIST; bit oriented memories; builtin self repair analyzer; builtin self test; comprehensive real time exhaustive search test and analysis; embedded word oriented memories; memory architecture; multiple bit failure; read cycle; Automatic testing; Built-in self-test; Engines; Failure analysis; Fault detection; Logic; Pipelines; Pulp manufacturing; Redundancy; System-on-a-chip;
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
DOI :
10.1109/ICVD.2004.1261044