Title :
Investigation of experimental verification for various Power Distribution Network cases through DLL Clock jitter affected by SSN
Author :
Shin, Minchul ; Shim, Jongjoo ; Shim, Yujeong ; Kim, Joungho
Author_Institution :
EECS, KAIST, Daejeon, South Korea
Abstract :
Delay Locked Loop (DLL) is essential circuit to design the low jitter synchronous transceiver system. One of the important performance factors on DLL is amount of clock jitter. Output clock jitter of DLL is affected by several noise sources including Simultaneous Switching Noise (SSN) from external circuit. SSN voltage becomes large portion and critical factor of analog circuit noise in mixed and complicated system. It is difficult to express the relation between SSN voltage and output clock jitter through numerical equation. SSN-to-jitter transfer function will be an effective estimation method for DLL output clock jitter. This transfer function means ratio of SSN voltage to output clock jitter on DLL circuit at each frequency. To obtain the SSN-to-jitter transfer function need to consider both circuit characteristic and Power Distribution Network impedance. In this paper, we present how to acquire the SSN-to-jitter transfer function on DLL considering PDN and investigate the changed transfer function depend on various PDN cases. Obtained SSN-to-jitter transfer function will be verified by measurement result.
Keywords :
analogue integrated circuits; clocks; delay lock loops; electric impedance; integrated circuit design; integrated circuit noise; jitter; transfer functions; DLL clock jitter; SSN voltage; SSN-to-jitter transfer function; analog circuit noise; delay locked loop; experimental verification; impedance; low jitter synchronous transceiver system; noise source; power distribution network; simultaneous switching noise; Analog circuits; Circuit noise; Clocks; Delay; Jitter; Power systems; Switching circuits; Transceivers; Transfer functions; Voltage;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475571