Title :
An improved dual-probe approach to measure noise source impedance
Author :
Bo, Zhao ; Min, Zhao ; Zhiming, Feng ; Limin, Shui ; Min, Yao
Author_Institution :
Coll. of Autom. Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
Abstract :
In this paper an improved dual-probe approach is proposed to measure the source impedance of conducted EMI noise. Two-impedance method, which can reduce the influence of testing cable loss caused by high frequency, instead of short-circuit method is used to minimize the measurement errors of conducted EMI noise source impedance. A switched-mode power supply (SMPS) is taken to measure its conducted EMI noise source impedance. Experimental results show that this method is feasible and can improve testing inaccuracy of conducted EMI noise source impedance.
Keywords :
electromagnetic interference; switched mode power supplies; EMI noise source impedance; cable loss; dual-probe approach; measurement errors; short circuit method; switched-mode power supply; two-impedance method; Circuit noise; Electromagnetic interference; Electromagnetic measurements; Extraterrestrial measurements; Frequency; Impedance measurement; Loss measurement; Noise measurement; Probes; Testing; Dual-probe Approach; Electromagnetic Interference (EMI); Noise Source Impedance;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475573
