DocumentCode :
2512091
Title :
Electrical and microstructural properties of screenprinted CdS layers for CdS-CdTe solar cells
Author :
Clemminck, I. ; Vervaet, A. ; Burgelman, M. ; Demeyere, A.
Author_Institution :
Lab. of Electron., Ghent State Univ., Belgium
fYear :
1988
fDate :
1988
Firstpage :
1585
Abstract :
Results are presented on an investigation into the development of electrical and microstructural properties of sintered CdS films as a function of sintering parameters, and the double role of the evaporating flux is illustrated. CdCl2 used in the sintering, acting both as a sintering flux and as an n-type dopant. The sintering temperature and sintering period were varied, and special attention was paid to the controlling of the flux evaporation. A study of the microstructural and electrical properties was performed, using SEM-analysis, atomic absorption spectroscopy, resistivity, and Hall measurements. Data are presented on grain size, sheet resistance, carrier concentration, and carrier mobility versus sintering parameters. The results are explained in terms of the double role of the evaporating flux. It is found that the microstructure of screen-printed CdS films, sintered with the aid of CdCl2 as a flux, is determined by the sintering temperature and by the effective sintering period, which is the period during which the flux can be kept active within the film.
Keywords :
Hall effect; II-VI semiconductors; cadmium compounds; carrier density; carrier mobility; crystal microstructure; electronic conduction in crystalline semiconductor thin films; grain size; scanning electron microscope examination of materials; semiconductor growth; sintering; solar cells; thick films; CdCl2; CdS-CdTe solar cells; Hall measurements; SEM-analysis; atomic absorption spectroscopy; carrier concentration; carrier mobility; electrical properties; evaporating flux; films; grain size; microstructural properties; n-type dopant; resistivity; screenprinted; sheet resistance; sintered; Absorption; Atomic measurements; Conductivity; Electric variables measurement; Electrical resistance measurement; Grain size; Performance evaluation; Photovoltaic cells; Spectroscopy; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
Type :
conf
DOI :
10.1109/PVSC.1988.105977
Filename :
105977
Link To Document :
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