Title :
A current sensor for on-chip, non-intrusive testing of RF systems
Author :
Soldo, Antonija ; Gopalan, Anand ; Mukund, P.R. ; Margala, Martin
Author_Institution :
Dept. of Electr. Eng., Rochester Inst. of Technol., NY, USA
Abstract :
This paper discusses design of a current sensor suitable for on-chip testing of RF circuits. The proposed sensor detects supply current (Idd) variations, with minimal impact on the circuit performance. Bandwidth of the circuit is 3.4 GHz, with a constant gain of 31.7 dB. The sensor has been implemented in IBM-6RF, 0.25 μ CMOS technology, with 2.5 V power supply and it offers the low real estate overhead and high dynamic range required for this application.
Keywords :
CMOS integrated circuits; electric sensing devices; integrated circuit testing; radiofrequency integrated circuits; 0.25 micron; 2.5 V; 3.4 GHz; 31.7 dB; CMOS technology; RF system testing; circuit bandwidth; current sensor design; nonintrusive testing; on-chip testing; Bandwidth; CMOS technology; Circuit optimization; Circuit testing; Current supplies; Gain; Radio frequency; Sensor systems; System testing; System-on-a-chip;
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
DOI :
10.1109/ICVD.2004.1261064
