• DocumentCode
    2512142
  • Title

    Rep-rate influence on electromagnetic effects

  • Author

    Palisek, Libor ; Suchy, Lubos

  • Author_Institution
    Div. VTUPV, VOP-026 Sternberk, s.p., Vyskov, Czech Republic
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    146
  • Lastpage
    149
  • Abstract
    Some results obtained during experimental measurements of susceptibility of electronics to HPM and UWB irradiation with repetition rate signals are presented in this paper. Repetition rate dependence is considered for temporary failures as well as for damage levels too. As equipments under test are chosen regular PC setups. Simple electronic circuit are added for some experiments for possibility to achieve more results related to damage levels. Suitable simplified circuit models for HPM and UWB repetition rate effectiveness for achieving of typical effects on electronics is used for simulations. For this purpose model based on electrothermal analogy is used within the software OrCAD 15.7 (PSpice model) environment. Results from measurements are compared with results from simulations. At the end of this presentation recommendation for effective HPM and UWB rep-rate necessary to achieve typical failures of tested equipments is carried out.
  • Keywords
    SPICE; circuit CAD; electromagnetic fields; radiation effects; HPM; OrCAD 15.7; PSpice model; UWB irradiation; electromagnetic effects; electronic circuit; electrothermal analogy; repetition rate dependence; repetition rate signals; Capacitance; Circuit simulation; Circuit testing; EMP radiation effects; Electric breakdown; Electromagnetic compatibility; Electromagnetic measurements; Frequency; Pulse circuits; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475592
  • Filename
    5475592