Title :
Resistive and photoconductive effects in spectral response measurements
Author :
Phillips, J.E. ; Roy, M.
Author_Institution :
Inst. of Energy Conversion, Delaware Univ., Newark, DE, USA
Abstract :
It is shown that AC spectral response measurements done under DC bias voltage and bias illumination can include nonnegligible modulation effects from the series resistance of the device under test. The modulation effects change both the shape and the magnitude of the spectral response curve as a function of bias voltage and bias illumination. It is shown how high-efficiency CuInSe2/CdS devices exhibit this kind of behavior and how to correct for it. By analyzing the spectral response of CuInSe2/CdS devices as a function of voltage bias, a value of the series resistance is extracted which agrees with that derived from I-V measurements.
Keywords :
II-VI semiconductors; cadmium compounds; copper compounds; photoconductivity; semiconductor junctions; ternary semiconductors; CuInSe2-CdS devices; modulation; photoconductive effects; resistive effects; semiconductor; series resistance; spectral response; Character generation; Difference equations; Diodes; Electrical resistance measurement; Energy measurement; Lighting; Photoconductivity; Shape; Short circuit currents; Spectral analysis; Testing; Thermal resistance; Voltage; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/PVSC.1988.105985