DocumentCode
2512254
Title
Dielectric study of allyl bromide and formamide mixtures using picoseconds time domain reflectometry
Author
Dharne, G.M. ; Kamble, Shilpa P. ; Tidar, A.L. ; Sonwane, P.T. ; Sayyad, S.B. ; Sudake, Y.S. ; Mharolkar, A.P. ; Patil, S.S. ; Khirade, P.W. ; Mehrotra, S.C.
Author_Institution
S.B.E.S. Coll. of Sci., Aurangabad
fYear
2008
fDate
21-24 Nov. 2008
Firstpage
829
Lastpage
832
Abstract
Dielectric study of allyl bromide, formamide and their binary mixtures have been carried out over the frequency range from 10 MHz to 20 GHz at temperatures 288 K, 298 K, 308 K and 318 K using Time Domain Reflectometry (TDR) for 11 different concentrations. Static dielectric constant, relaxation time, Kirkwood correlation factor, Excess parameters were estimated information regarding the molecular structure and dynamics of the mixture are also discussed. The values of static dielectric constant and relaxation time increases with increase in concentration of formamide in allyl bromide. The Bruggeman plots show a non-linearity of the curves for all the concentrations and all temperatures indicating the heterointeraction which may be due to hydrogen bonding of the -NH2 group of formamide with C-Br group of allyl bromide. The excess inverse relaxation time values are negative for all the concentrations and all temperatures indicating that the solute-solvent interaction hinders the rotation of the dipoles of the system. Kirkwood correlation factor increases as the concentration of formamide increases which confirms the intermolecular interaction through hydrogen bonding in the system.
Keywords
dielectric relaxation; high-speed techniques; hydrogen bonds; microwave reflectometry; organic compounds; permittivity measurement; time-domain reflectometry; Bruggeman plots; Kirkwood correlation factor; TDR; allyl bromide; binary mixtures; dielectric relaxation time; formamide; frequency 10 MHz to 20 GHz; hydrogen bonding; intermolecular interaction; molecular structure; picosecond time domain reflectometry; solute-solvent interaction; static dielectric constant; temperature 288 K; temperature 298 K; temperature 308 K; temperature 318 K; Bonding; Chemicals; Dielectric constant; Dielectric liquids; Electromagnetic heating; Frequency dependence; Hydrogen; Permittivity; Reflectometry; Temperature distribution; Allyl bromide; Bruggeman factor; Dielectric relaxation; Formamide; Kirkwood correlation factor; Time Domain Reflectometry;
fLanguage
English
Publisher
ieee
Conference_Titel
Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
Conference_Location
Jaipur
Print_ISBN
978-1-4244-2690-4
Electronic_ISBN
978-1-4244-2691-1
Type
conf
DOI
10.1109/AMTA.2008.4763122
Filename
4763122
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