• DocumentCode
    2512575
  • Title

    Cone-beam Tomography from Short-Scan Circle-plus-Arc Data Measured on a C-arm System

  • Author

    Hoppe, Stefan ; Dennerlein, Frank ; Lauritsch, Gunter ; Hornegger, Joachim ; Noo, Frederic

  • Author_Institution
    Inst. of Pattern Recognition, Erlangen-Nuremberg Univ., Erlangen
  • Volume
    5
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    2873
  • Lastpage
    2877
  • Abstract
    In C-arm computed tomography (CT) systems, the source trajectory does not follow an ideal trajectory. Thus, the real data acquisition geometry is typically expressed by a sequence of projection matrices. However, exact reconstruction algorithms are based on an analytic expression of the projection geometry. In this work, we present a reformulation of an exact reconstruction method to handle projection matrices. In particular, the M-line approach is investigated for a short-scan circle-plus-arc data acquisition. The computation of the derivative with respect to the source trajectory is numerically most critical for which a novel and stable implementation is developed. In order to determine the backprojection range, a 2D polygonal weighting scheme is proposed. Image results are presented from phantom data acquired by a Siemens AXIOM Artis C-arm system. Excellent image results are achieved. Due to the complete data acquisition, the problem of cone artifacts is totally resolved.
  • Keywords
    computerised tomography; medical image processing; 2D polygonal weighting scheme; C-arm computed tomography systems; M-line approach; Siemens AXIOM Artis C-arm system; cone-beam tomography; exact reconstruction method; projection matrices; Algorithm design and analysis; Biomedical imaging; Computed tomography; Data acquisition; Detectors; Geometry; Image reconstruction; Nuclear and plasma sciences; Nuclear measurements; Reconstruction algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.356476
  • Filename
    4179633