Linearity testing of Analog-to-Digital Converters using imprecise sinusoidal excitations

Author

Vasan, Bharath K. ; Chen, Degang J. ; Geiger, Randall L.

Author_Institution

Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA

fYear

2010

fDate

14-16 July 2010

Firstpage

334

Lastpage

337

Abstract

One of the biggest challenges associated with testing the linearity of high performance Analog-to-Digital Converters (ADCs) is generating a test stimulus more linear or spectrally more pure than the device under test. In this paper we propose algorithms that allow easy to generate, imprecise sinusoidal excitations that differ by a constant voltage to characterize the Integral nonlinearity (INL) of high resolution ADCs. Simulation results indicate that sine waves with SFDR<;40dB can be used to accurately identify the INL of 16-bit ADCs with the proposed methods.

Keywords

analogue-digital conversion; integrated circuit testing; ADC; analog-to-digital converters; constant voltage; imprecise sinusoidal excitations; integral nonlinearity; linearity testing; Converters; Estimation error; Histograms; Linearity; Simulation; Testing; Analog-to-Digital converter(ADC); Differential Non Linearity(DNL); Integral Non Linearity(INL); Stimulus Error Identification and Removal(SEIR); Stimulus Error Removal(SER);

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace and Electronics Conference (NAECON), Proceedings of the IEEE 2010 National

Conference_Location

Fairborn, OH

ISSN

0547-3578

Print_ISBN

978-1-4244-6576-7

Type

conf

DOI

10.1109/NAECON.2010.5712973

Filename

5712973