DocumentCode
2512660
Title
Thermal design of integrated circuit devices
Author
Palisoc, Arthur L. ; Lee, Chin C.
Author_Institution
Dept. of Electr. Eng., California Univ., Irvine, CA, USA
fYear
1988
fDate
10-12 Feb 1988
Firstpage
118
Lastpage
121
Abstract
An analytical solution derived by the authors (1986) for the thermal analysis of multisource, four-layer ICs has been useful in simulating device thermal properties. However, in the simulation of structures with large chip-to-heat-source size ratios, the computer program based on the exact solution requires a substantial amount of CPU time, making it impossible to carry out real-time thermal design of ICs having large numbers of small heat sources. A method is presented for the computer-aided thermal design of ICs in real time. This method uses a multiple regression technique whose input is the thermal profile due to a unit heat source over a multilayered unit structure. The profile in two dimensions is matched to an equation having several parameters. The temperature profiles of other devices having the same layered structure is computed by superposing the profile generated by the matched equation, shifted in position according to the source location and weighted by the source power
Keywords
circuit CAD; digital simulation; heat sinks; integrated circuit technology; real-time systems; temperature distribution; IC CAD; computer-aided thermal design; multilayered unit structure; multiple regression technique; real time; temperature profiles; thermal profile; unit heat source; Analytical models; Central Processing Unit; Circuit simulation; Computational modeling; Computer simulation; Equations; Finite difference methods; Finite element methods; Temperature; Thermal engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal and Temperature Measurement Symposium, 1988. SEMI-THERM IV., Fourth Annual IEEE
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/SEMTHE.1988.10612
Filename
10612
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