DocumentCode
2512695
Title
Robustness of ESD protection structures against automotive transient disturbances
Author
Deutschmann, Bernd ; Magrini, Filippo ; Cao, Yiqun
Author_Institution
Infineon Technol. AG, Neubiberg, Germany
fYear
2010
fDate
12-16 April 2010
Firstpage
1028
Lastpage
1031
Abstract
Predicting if an ESD protection structure is able to handle transient disturbances without being destroyed is very important in order to select the right protection concept for ICs. This paper shows how the energy content of typical automotive transient disturbances can be predicted and how the failure power of an ESD protection structure was derived from measurements and calculations. It shows to what extent a standard ESD protection structure is able to handle ISO 7637 automotive test pulses of much higher energies.
Keywords
ISO standards; automotive electronics; electrostatic discharge; integrated circuits; transient analysis; ESD protection structures; IC; ISO 7637 automotive test; automotive transient disturbances; Automotive engineering; EMP radiation effects; Electrostatic discharge; ISO standards; Protection; Pulse generation; Pulse shaping methods; Robustness; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475620
Filename
5475620
Link To Document