• DocumentCode
    2512695
  • Title

    Robustness of ESD protection structures against automotive transient disturbances

  • Author

    Deutschmann, Bernd ; Magrini, Filippo ; Cao, Yiqun

  • Author_Institution
    Infineon Technol. AG, Neubiberg, Germany
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1028
  • Lastpage
    1031
  • Abstract
    Predicting if an ESD protection structure is able to handle transient disturbances without being destroyed is very important in order to select the right protection concept for ICs. This paper shows how the energy content of typical automotive transient disturbances can be predicted and how the failure power of an ESD protection structure was derived from measurements and calculations. It shows to what extent a standard ESD protection structure is able to handle ISO 7637 automotive test pulses of much higher energies.
  • Keywords
    ISO standards; automotive electronics; electrostatic discharge; integrated circuits; transient analysis; ESD protection structures; IC; ISO 7637 automotive test; automotive transient disturbances; Automotive engineering; EMP radiation effects; Electrostatic discharge; ISO standards; Protection; Pulse generation; Pulse shaping methods; Robustness; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475620
  • Filename
    5475620