• DocumentCode
    2512890
  • Title

    Fast prediction of the electromagnetic shielding of small apertures coated by conductive thin films

  • Author

    D´Amore, Marcello ; De Santis, Valerio ; Feliziani, Mauro

  • Author_Institution
    Dept. of Electr. Eng., Sapienza Univ. of Rome, Rome, Italy
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    524
  • Lastpage
    527
  • Abstract
    The paper deals with the fast prediction of the electromagnetic shielding performances of aperture loaded by resistive thin film coatings. The electromagnetic shielding problem is addressed by the finite element method (FEM). The shielding configuration is analysed by modeling open apertures by an equivalent sheet impedance that is introduced in the FEM computational domain as an internal artificial boundary. Equivalent loaded apertures are also proposed to reduce the computational cost. Simple test cases of plane wave shielding problems are presented to show the efficiency of the proposed method.
  • Keywords
    electromagnetic shielding; finite element analysis; thin films; FEM computational domain; conductive thin films; electromagnetic shielding; equivalent sheet impedance; finite element method; internal artificial boundary; plane wave shielding problems; Apertures; Coatings; Computational efficiency; Conductive films; Electromagnetic compatibility; Electromagnetic shielding; Finite element methods; Magnetic shielding; Surface impedance; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475632
  • Filename
    5475632