DocumentCode :
2512890
Title :
Fast prediction of the electromagnetic shielding of small apertures coated by conductive thin films
Author :
D´Amore, Marcello ; De Santis, Valerio ; Feliziani, Mauro
Author_Institution :
Dept. of Electr. Eng., Sapienza Univ. of Rome, Rome, Italy
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
524
Lastpage :
527
Abstract :
The paper deals with the fast prediction of the electromagnetic shielding performances of aperture loaded by resistive thin film coatings. The electromagnetic shielding problem is addressed by the finite element method (FEM). The shielding configuration is analysed by modeling open apertures by an equivalent sheet impedance that is introduced in the FEM computational domain as an internal artificial boundary. Equivalent loaded apertures are also proposed to reduce the computational cost. Simple test cases of plane wave shielding problems are presented to show the efficiency of the proposed method.
Keywords :
electromagnetic shielding; finite element analysis; thin films; FEM computational domain; conductive thin films; electromagnetic shielding; equivalent sheet impedance; finite element method; internal artificial boundary; plane wave shielding problems; Apertures; Coatings; Computational efficiency; Conductive films; Electromagnetic compatibility; Electromagnetic shielding; Finite element methods; Magnetic shielding; Surface impedance; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475632
Filename :
5475632
Link To Document :
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