DocumentCode :
251306
Title :
A two dimensional analytical model of drain to source current and subthreshold slope of a triple material double gate MOSFET
Author :
Mahmud, M.A. ; Subrina, S.
Author_Institution :
Dept. of Electr. & Electron. Eng., Bangladesh Univ. of Eng. & Technol., Dhaka, Bangladesh
fYear :
2014
fDate :
20-22 Dec. 2014
Firstpage :
92
Lastpage :
95
Abstract :
A two dimensional analytical model of drain to source current as well as subthreshold slope of a triple material double gate MOSFET has been developed in this work. Basic drift-diffusion equation has been used to derive the drain to source current model. An expression of pinch-off voltage has been derived for modeling drain current in saturation region. The current in the device has been studied as function of drain to source voltage and gate voltage as well. In the work, leakage current in zero gate bias condition has also been presented. Variations in subthreshold slope of the device owing to change in device parameters have been lifted up. Our model results have been verified with the simulation data obtained by using a professional numerical device simulator.
Keywords :
MOSFET; leakage currents; semiconductor device models; basic drift-diffusion equation; device parameters; drain to source current model; drain to source voltage function; gate voltage; leakage current; pinch-off voltage expression; professional numerical device simulator; saturation region; subthreshold slope; triple material double gate MOSFET; two dimensional analytical model; zero gate bias condition; Analytical models; Leakage currents; Logic gates; MOSFET; Materials; Mathematical model; Threshold voltage; Drain to source current; gate engineering; leakage current; pinch off voltage; subthreshold slope;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering (ICECE), 2014 International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4799-4167-4
Type :
conf
DOI :
10.1109/ICECE.2014.7026926
Filename :
7026926
Link To Document :
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