DocumentCode

2513064

Title

Thermal Fluctuation Aftereffect of Exchange Coupled Films for Spin Valve Devices

Author

Fujikata, J. ; Hayashi, K. ; Yamamoto, Hiroshi ; Nakada, Mayumi

Author_Institution

NEC Corp., Japan

fYear

1998

fDate

6-9 Jan. 1998

Firstpage

308

Lastpage

308

Keywords

Annealing; Antiferromagnetic materials; Buffer layers; Fluctuations; Grain size; Helium; Magnetic field measurement; Spin valves; Temperature; Thermal stability;

fLanguage

English

Publisher

ieee

Conference_Titel

MMM-Intermag Conference, 1998. Abstracts., The 7th Joint

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-5118-5

Type

conf

DOI

10.1109/INTMAG.1998.742500

Filename

742500