• DocumentCode
    2513296
  • Title

    Roles of ESD played in large computing system availability & reliability

  • Author

    Soohoo, Kwok M.

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    463
  • Lastpage
    466
  • Abstract
    Product ESD testing per CISPR test requirements specifies direct and/or indirect ESD injection to the outside of the chassis of the product under test or to a vertical or horizontal coupling plane. In this paper additional ESD testing to insure customer satisfaction with large systems is discussed. Two additional ESD test methods are discussed with test locations internal to the normal external shield. First, the application of ESD during manufacturing process is intended to find product defects in order to increase field reliability. Second, internal system testing is intended to mimic potential problems from concurrent maintenance in order to insure system availability during system repair actions without impacting system availability for continuous customer usage.
  • Keywords
    customer satisfaction; electron device testing; electronic equipment testing; maintenance engineering; reliability; CISPR test requirement; ESD testing; concurrent maintenance; customer satisfaction; internal system testing; product defect screening; reliability; system availability; Availability; Circuit testing; Electromagnetic compatibility; Electrostatic discharge; History; Maintenance; Manufacturing; Probes; Relays; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475656
  • Filename
    5475656