• DocumentCode
    2513391
  • Title

    A pocket discharge model for narrow bipolar events and possible applications

  • Author

    Zhu, Baoyou ; Lv, Fanchao ; Ma, Dong ; Zhou, Helin

  • Author_Institution
    Sch. of Earth & Space Sci., Univ. of Sci. & Technol. of China, Hefei, China
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1558
  • Lastpage
    1561
  • Abstract
    Narrow bipolar events refer to a distinct type of in-cloud lightning discharge which produces electric field of bipolar and impulse in nature. In this presentation narrow bipolar events were considered as the discharge of the pocket charge to the charge layer inside thundercloud, and the current wave-shape possibly responsible for the narrow bipolar electromagnetic field was featured by two channel-conducting-state depended parameters (α,β). The parameter β inversely reflects the time for the current front to propagate along the channel and can be achieved by the perfect fit of the measured field waveform to the model field waveform with the channel length and current propagation speed bound by the parameter β. The present model was applied to the narrow bipolar fields of two narrow bipolar events to reach a parameter β of 0.333 μs-1 and 0.353 μs-1 respectively, indicating a channel length less than 1km.
  • Keywords
    atmospheric electromagnetic wave propagation; atmospheric techniques; clouds; lightning; channel length; charge layer; current propagation speed; current wave-shape; in-cloud lightning discharge; model field waveform; narrow bipolar electromagnetic field; narrow bipolar events; pocket charge; pocket discharge model; thundercloud; two channel-conducting-state; Charge measurement; Current measurement; Electric breakdown; Electromagnetic compatibility; Electromagnetic fields; Fluid flow measurement; Lightning; Optical propagation; Radio frequency; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475661
  • Filename
    5475661