DocumentCode :
2513418
Title :
Face Recognition Across Pose with Automatic Estimation of Pose Parameters through AAM-Based Landmarking
Author :
Teijeiro-Mosquera, Lucía ; Alba-Castro, José Luis ; González-Jiménez, Daniel
Author_Institution :
Univ. of Vigo, Vigo, Spain
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
1339
Lastpage :
1342
Abstract :
In this paper we present a fully automatic system for face recognition across pose where no frontal view is needed in enrollment or test. The system uses three Active Appearance Models(AAMs): the first one is a generic multi resolution AAM, while the remaining ones are trained to cope with left/right variations (i.e. pose-dependent AAMs). During the fitting stage, pose is automatically estimated using eigenvector analysis, and a synthetic face is generated through texture warping. Results over CMU PIE Database show promising results compared to the performance achieved with manually land marked faces.
Keywords :
eigenvalues and eigenfunctions; face recognition; pose estimation; visual databases; AAM; AAM-based landmarking; CMU PIE database; active appearance models; automatic estimation; eigenvector analysis; face recognition across pose; pose parameters; texture warping; Databases; Estimation; Face; Face recognition; Image resolution; Probes; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.332
Filename :
5597720
Link To Document :
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