Title :
Efficient modeling of apertures in thin conducting screens by the TLM method
Author :
Argus, P. ; Fischer, P. ; Konrad, A. ; Schwab, A.J.
Author_Institution :
IEH, Karlsruhe Univ., Germany
Abstract :
The shielding effectiveness of enclosures used in EMC is often determined by apertures. Mostly these apertures are small compared to the wavelength and the enclosure´s dimensions. The modeling with numerical field calculation methods can therefore be difficult. This paper presents the extension of the transmission line matrix (TLM) method by special subcellular structures leading to an efficient modeling of apertures in the time domain
Keywords :
conducting bodies; electromagnetic compatibility; electromagnetic fields; electromagnetic shielding; packaging; transmission line matrix methods; EMC; TLM method; aperture modeling; efficient modeling; enclosure dimensions; enclosures; measurement data; numerical field calculation methods; shielding effectiveness; subcellular structures; thin conducting screens; transmission line matrix; wavelength; Apertures; Electromagnetic compatibility; Electromagnetic scattering; Geometry; Numerical models; Parallel processing; Power system modeling; TV; Telephony; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.875545
