DocumentCode
2513434
Title
Efficient modeling of apertures in thin conducting screens by the TLM method
Author
Argus, P. ; Fischer, P. ; Konrad, A. ; Schwab, A.J.
Author_Institution
IEH, Karlsruhe Univ., Germany
Volume
1
fYear
2000
fDate
2000
Firstpage
101
Abstract
The shielding effectiveness of enclosures used in EMC is often determined by apertures. Mostly these apertures are small compared to the wavelength and the enclosure´s dimensions. The modeling with numerical field calculation methods can therefore be difficult. This paper presents the extension of the transmission line matrix (TLM) method by special subcellular structures leading to an efficient modeling of apertures in the time domain
Keywords
conducting bodies; electromagnetic compatibility; electromagnetic fields; electromagnetic shielding; packaging; transmission line matrix methods; EMC; TLM method; aperture modeling; efficient modeling; enclosure dimensions; enclosures; measurement data; numerical field calculation methods; shielding effectiveness; subcellular structures; thin conducting screens; transmission line matrix; wavelength; Apertures; Electromagnetic compatibility; Electromagnetic scattering; Geometry; Numerical models; Parallel processing; Power system modeling; TV; Telephony; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-5677-2
Type
conf
DOI
10.1109/ISEMC.2000.875545
Filename
875545
Link To Document