• DocumentCode
    2513438
  • Title

    Feature Extraction Based on Class Mean Embedding (CME)

  • Author

    Wan, Minghua ; Lai, Zhihui ; Jin, Zhong

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    4174
  • Lastpage
    4177
  • Abstract
    Recently, local discriminant embedding (LDE) was proposed to manifold learning and pattern classification. In LDE framework, the neighbor and class of data points were used to construct the graph embedding for classification problems. From a high dimensional to a low dimensional subspace, data points of the same class maintain their intrinsic neighbor relations, whereas neighboring data points of different classes no longer stick to one another. But, neighboring data points of different classes are not deemphasized efficiently by LDE and it may degrade the performance of classification. In this paper, we investigated its extension, called class mean embedding (CME), using class mean of data points to enhance its discriminant power in their mapping into a low dimensional space. Experimental results on ORL and FERET face databases show the effectiveness of the proposed method.
  • Keywords
    face recognition; feature extraction; graph theory; image classification; learning (artificial intelligence); FERET face database; LDE framework; ORL face database; class mean embedding; data point; feature extraction; graph embedding; local discriminant embedding; low dimensional space mapping; manifold learning; neighbor relation; pattern classification; Accuracy; Databases; Face; Face recognition; Manifolds; Principal component analysis; Training; graph embedding; local discriminant embedding (LDE); manifold learning; pattern classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.1014
  • Filename
    5597722