DocumentCode :
2513698
Title :
Evaluation of Effective Polarisation Charges and Interface States from High Frequency C-V Hysteresis Measurements
Author :
Rao, T. Sudersena ; Mansingh, A.
fYear :
1986
fDate :
8-11 June 1986
Firstpage :
599
Lastpage :
601
Keywords :
Capacitance-voltage characteristics; Current measurement; Ferroelectric films; Ferroelectric materials; Frequency measurement; Hysteresis; Interface states; Polarization; Semiconductor films; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics. 1986 Sixth IEEE International Symposium on
Conference_Location :
Bethlehem, PA, USA
Type :
conf
DOI :
10.1109/ISAF.1986.201215
Filename :
1538155
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2513698
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