• DocumentCode
    2513698
  • Title

    Evaluation of Effective Polarisation Charges and Interface States from High Frequency C-V Hysteresis Measurements

  • Author

    Rao, T. Sudersena ; Mansingh, A.

  • fYear
    1986
  • fDate
    8-11 June 1986
  • Firstpage
    599
  • Lastpage
    601
  • Keywords
    Capacitance-voltage characteristics; Current measurement; Ferroelectric films; Ferroelectric materials; Frequency measurement; Hysteresis; Interface states; Polarization; Semiconductor films; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics. 1986 Sixth IEEE International Symposium on
  • Conference_Location
    Bethlehem, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISAF.1986.201215
  • Filename
    1538155