Title :
Experimental verification for field to transmission line coupling using TEM cell
Author :
Park, Beom Jun ; Ju, Jae Cheol ; Lee, Hyun Young ; Park, Dong Chul
Author_Institution :
Dept. of Radio Sci. & Eng., Chungnam Nat. Univ., Taejon, South Korea
Abstract :
Although several papers have been published on undesired electromagnetic coupling on multiconductor transmission lines (MTLs) due to an incident electromagnetic pulse, experimental validations in the time-domain are rarely found. This paper presents an accurate and simple experimental verification for the field to transmission line coupling using a TEM cell. The measured results are in good agreement with simulated ones obtained by the finite difference-time domain (FDTD) method
Keywords :
electromagnetic compatibility; electromagnetic coupling; electromagnetic fields; electromagnetic pulse; finite difference time-domain analysis; multiconductor transmission lines; test facilities; EM field to transmission line coupling; EMC measurement; EMI measurement; FDTD method; TEM cell; electromagnetic compatibility; electromagnetic coupling; experimental verification; finite difference-time domain method; incident electromagnetic pulse; line losses; linear loads; measured results; multiconductor transmission lines; shielded environment; simulated results; time-domain validations; transverse electromagnetic cell; Conductors; EMP radiation effects; Electromagnetic coupling; Electromagnetic measurements; Impedance; TEM cells; Time domain analysis; Transmission line measurements; Transmission line theory; Transmission lines;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.875565
