DocumentCode :
2514019
Title :
A novel time domain method to extract equivalent circuit model of patterned ground structures
Author :
Cheng, Chi-Hsuan ; Tsai, Chung-Hao ; Wu, Tzong-Lin
Author_Institution :
Dept. of Electr. of Eng. & Grad. Inst. of Commun. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
622
Lastpage :
624
Abstract :
A novel and efficient time-domain method is proposed to extract the equivalent circuit model of the defected ground structure. Based on time domain reflection analysis and Laplace transform, two analytical equations are derived to compute the corresponding L and C values. The non-ideal effect of the excitation source, nonzero rising time, in the TDR measurement and analysis is also considered. This method can be used to extract models for DGSs in any shape. A test sample is fabricated on FR4 substrate to verify the extracting method. The model extracted by the proposed method has a very good agreement with the simulation and measurement both in time domain and frequency domain.
Keywords :
Laplace transforms; equivalent circuits; microstrip lines; time-domain analysis; time-domain reflectometry; FR4 substrate; Laplace transform; TDR measurement; defected ground structure; equivalent circuit model extraction; frequency domain analysis; microstrip line; patterned ground structures; time domain method; time domain reflection analysis; time domain reflectometry; Capacitance; Capacitors; Electromagnetic modeling; Equivalent circuits; Impedance; Inductance; Inductors; Microstrip; Reflection; Time domain analysis; defected ground structure; time domain reflectometry(TDR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475691
Filename :
5475691
Link To Document :
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