Title :
Emerging standards reduce product life-cycle costs
Author :
Jackson, Andrew M.
Author_Institution :
GenRad Inc., Concord, MA, USA
Abstract :
The product development lifecycle and in particular the transition in the product development lifecycle from the design phase to the test phase is hampered by the inability of point tools to be integrated into a common development environment. This paper describes the integration of test preparation tools from a board test system into an Electronic Design Automation (EDA) environment
Keywords :
CAD; automatic test equipment; automatic testing; avionics; design for testability; economics; printed circuit testing; product development; standards; Electronic Design Automation environment; GENESIS extension language; MCATES tools; board test system; cockpit; product development lifecycle; product life-cycle costs; standards; test preparation tools; Automatic testing; Costs; Design automation; Electronic design automation and methodology; Electronic equipment testing; Environmental management; Product development; Software systems; Standards development; System testing;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381519
