Title :
Rigorous modeling of the frequency dependence of ohmic losses in high-speed electrical interconnections
Author :
Coperich, Karen M. ; Cangellaris, Andreas C. ; Ruehli, Albert E.
Author_Institution :
Illinois Univ., Urbana, IL, USA
Abstract :
A systematic methodology is presented for the development of SPICE-compatible models for printed circuit board interconnections exhibiting dispersion due to ohmic loss and skin effect. The important attributes of this methodology are: (a) a rigorous and computationally efficient approach for the extraction of the per-unit-length, frequency-dependent resistance and inductance matrices for a system of coupled interconnects. (b) The systematic development of an equivalent circuit for the discrete approximation of the generalized transmission line equations, that can be readily incorporated in standard SPICE-like circuit simulators
Keywords :
SPICE; circuit simulation; equivalent circuits; impedance matrix; interconnections; losses; printed circuits; skin effect; transmission line theory; SPICE-compatible models; SPICE-like circuit simulators; coupled interconnects; discrete approximation; dispersion; equivalent circuit; frequency dependence; frequency-dependent resistance; generalized transmission line equations; high-speed electrical interconnections; inductance matrices; ohmic losses; printed circuit board interconnections; skin effect; Coupling circuits; Dispersion; Distributed parameter circuits; Equivalent circuits; Frequency dependence; Inductance; Integrated circuit interconnections; Printed circuits; Skin effect; Transmission line matrix methods;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.875582