Title :
Internal/external test harmonization, verticality and performance metrics-a systems approach
Author_Institution :
JKS Syst. Ltd., Westlake Village, CA, USA
Abstract :
On-line BIT (built in test) and off-line TPS (test program sets) both suffer from a history of chronic performance deficiencies. Many of these deficiencies can be remedied by more closely coordinating concurrent BIT/TPS development and by applying the same quantitative test performance metrics to both areas under a vertical test design approach
Keywords :
automatic test software; failure analysis; fault diagnosis; fault location; military computing; program verification; software engineering; software performance evaluation; US Navy; concurrent BIT/TPS development; internal/external test harmonization; off-line TPS; online BIT; performance metrics; quantitative test performance metrics; systems approach; test program sets; vertical test design; verticality; Assembly; Automatic testing; Documentation; Fault detection; Hardware; History; Process design; Procurement; Software testing; System testing;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381529
