• DocumentCode
    2514214
  • Title

    Error floors in LDPC codes: Fast simulation, bounds and hardware emulation

  • Author

    Lee, Pamela ; Dolecek, Lara ; Zhang, Zhengya ; Anantharam, Venkat ; Borivoje ; Wainwright, Martin J.

  • Author_Institution
    EECS Dept., Univ. of California, Berkeley, CA
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    444
  • Lastpage
    448
  • Abstract
    The error-correcting performance of low-density parity check (LDPC) codes, when decoded using practical iterative decoding algorithms, is known to be very close to Shannon limits in the asymptotic limit of large blocklengths. A substantial limitation to the use of finite-length LDPC codes is the presence of an error floor in the low frame error rate (FER) region. This paper develops two methods, a stochastic one based on importance sampling and a deterministic one based on high SNR asymptotics, as applied to suitably defined absorbing structures within the LDPC code, to predict error floors. Our results are in very close agreement with hardware-based experimental results, and moreover extend the prediction of the error probability to as low as 10-30. Our deterministic estimates are guaranteed to be a lower bound to the error probability in the high SNR regime.
  • Keywords
    block codes; error correction codes; error statistics; iterative decoding; parity check codes; stochastic processes; LDPC codes; Shannon limits; error floors; error probability; error-correcting performance; hardware-based experimental results; high SNR asymptotics methods; iterative decoding algorithms; low frame error rate region; low-density parity check codes; stochastic methods; Bit error rate; Emulation; Error analysis; Error probability; Hardware; Iterative algorithms; Iterative decoding; Maximum likelihood decoding; Monte Carlo methods; Parity check codes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2008. ISIT 2008. IEEE International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-2256-2
  • Electronic_ISBN
    978-1-4244-2257-9
  • Type

    conf

  • DOI
    10.1109/ISIT.2008.4595025
  • Filename
    4595025