DocumentCode
2514327
Title
Robust watermarking for T-spline surfaces based on nonuniform B-spline wavelets transformation
Author
Bin, Weng ; Ri-jing, Pan ; Zhi-qiang, Yao ; Jun, Xiao ; Shan-chao, Yang
Author_Institution
Key Lab. of Network Security & Cryptology, Fujian Normal Univ., Fuzhou, China
fYear
2010
fDate
28-30 Nov. 2010
Firstpage
335
Lastpage
338
Abstract
T-spline surfaces are widely used in entertainment, engineering, science and medicine. Nonuniform B-spline wavelets transformation is introduced into T-spline surfaces watermarking, and a scheme is proposed for embedding watermarks into T-spline surfaces. In watermark embeding stage, firstly, the points are selected from the standard T-spline surfaces. Secondly, the points are decomposited by nonumiform B-spline wavelets transformation, then the watermarks are embedded into its lower resolution coefficients, and then the watermarked points are obtained by the B-spline wavelets reconstruction. Finally, the watermarked T-spline surfaces are obtained by modifing the T-spline control points. In watermark extracting stage, the same points selection and wavelets decomposition processes are performed to both the original surfaces and the watermarked surfaces, then the watermarks are obtained according to the differences of their lower resolution coefficients. Experimental results show that the proposed scheme is robust against attacks such as translation, rotation, uniform scaling, noise addition, control points modification, weights modification, local knot insertion and control point removal.
Keywords
splines (mathematics); watermarking; wavelet transforms; B-spline wavelets transformation; T-spline surfaces; lower resolution coefficients; robust watermarking; Robustness; Solid modeling; Spline; Surface reconstruction; Surface waves; Watermarking; Wavelet transforms; B-spline; T-spline; watermarking; wavelets transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Computing and Telecommunications (YC-ICT), 2010 IEEE Youth Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-8883-4
Type
conf
DOI
10.1109/YCICT.2010.5713113
Filename
5713113
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