DocumentCode :
2514452
Title :
Material characterization at low frequencies using THz and Raman spectroscopy
Author :
Kutuvantavida, Y. ; Williams, G.V.M. ; Pogson, E.M. ; Bhuiyan, M.D.H. ; Radhanpura, K. ; Lewis, R.A.
Author_Institution :
Ind. Res. Ltd., Lower Hutt, New Zealand
fYear :
2012
fDate :
23-28 Sept. 2012
Firstpage :
1
Lastpage :
3
Abstract :
We present results from wideband THz, low wave-number Raman, and FTIR measurements on benzoic acid and two of its derivatives. The low energy vibrational modes have been identified and compared with the results from calculations.
Keywords :
Fourier transform spectra; Raman spectra; Raman spectroscopy; infrared spectra; organic compounds; terahertz spectroscopy; terahertz wave spectra; vibrational modes; FTIR measurements; Raman spectroscopy; THz spectroscopy; benzoic acid; low energy vibrational modes; low wave-number Raman; material characterization; wideband THz; Absorption; Compounds; Crystals; Hydrogen; Spectroscopy; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2012 37th International Conference on
Conference_Location :
Wollongong, NSW
ISSN :
2162-2027
Print_ISBN :
978-1-4673-1598-2
Electronic_ISBN :
2162-2027
Type :
conf
DOI :
10.1109/IRMMW-THz.2012.6380457
Filename :
6380457
Link To Document :
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