DocumentCode :
2514485
Title :
Study of susceptibility of an MCU control system in the automotive field
Author :
Wan, Fayu ; Duval, Fabrice ; Savatier, Xavier ; Louis, Anne ; Belahcene, Mazari
Author_Institution :
IRSEEM, ESIGELEC Technopole clu Madrillet, St. Etienne du Rouvray, France
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
610
Lastpage :
613
Abstract :
This paper introduces a technique to detect the EMI environment of MCU relying on itself. The measurement setup is explained in detail. Furthermore, based on measurement, an output signal data library and susceptibility results are achieved. Finally, we present a technique which can detect disturbance and PMS (program multi-switching) system which can increase the reliability of MCU control DC Motor system and guarantee system speed. The final objective of the work is to develop software technique to increase the reliability of MCU system in the automotive field.
Keywords :
DC motors; automobiles; control engineering computing; electromagnetic interference; DC motor system; EMI environment; MCU control system; automotive field; program multi-switching system; Automotive engineering; Computer displays; Control systems; Electromagnetic compatibility; Electromagnetic interference; Immunity testing; MATLAB; Oscilloscopes; Signal generators; Software libraries;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475715
Filename :
5475715
Link To Document :
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