DocumentCode :
2514606
Title :
Test strategies for power supplies
Author :
Carmichael, Norman ; Camargo, Christopher ; Harrison, Travis ; Gomez, Ralph
Author_Institution :
Southwest Res. Inst., San Antonio, TX, USA
fYear :
1994
fDate :
20-22 Sep 1994
Firstpage :
681
Lastpage :
692
Abstract :
Functional and diagnostic testing of switching power supplies offers unique challenges. The control loop and the prevalence of destructive and avalanche failure modes make it difficult to analyze and diagnose many failures. Traditional approaches to resting were applied to power supplies and proved inadequate. This paper illustrates, through examples, some of the problems encountered and their solutions. This paper will also discuss the process through which a depot level power supply tester, the Advanced Power Supply Tester (APST), was defined. The tester features a software environment and Graphical User Interface (GUT) provided by LabWindows CVI and FineSoft, hardware consisting of an assembly of laboratory quality instrumentation, and diagnostic tools
Keywords :
automatic test equipment; automatic test software; automatic testing; switched mode power supplies; Advanced Power Supply Tester; FineSoft; Graphical User Interface; LabWindows CVI; avalanche failure mode; control loop; depot level power supply tester; destructive failure modes; diagnostic testing; functional testing; software environment; switching power supplies; Assembly; Automatic testing; Circuit testing; Frequency measurement; Graphical user interfaces; Hardware; Instruments; Power measurement; Power supplies; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
Type :
conf
DOI :
10.1109/AUTEST.1994.381551
Filename :
381551
Link To Document :
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