DocumentCode :
251481
Title :
Estimating the transit time of an AlyGa1−yAs HBT in the Gaussian doped base region for low to moderately high level of injection
Author :
Jahan, Nusrat ; Mannan, Rowshon Ara ; Biswas, Priyanka ; Arafat, Yeasir
Author_Institution :
Dept. of Electr., Electron. & Commun. Eng., Dhaka, Bangladesh
fYear :
2014
fDate :
20-22 Dec. 2014
Firstpage :
800
Lastpage :
803
Abstract :
For a Gaussian doped graded base AlGaAs Hetero-junction Bipolar Transistor (HBT), base transit time (BTT) has been determined using a suitable analytical model. Here the authors have investigated the dependency of base transit time on different physical and input parameters such as the collector current density, base emitter voltage etc. Electric field dependent carrier mobility also has been included into the analytic model and found that the base transit time worsens compared to the value found without taken the field dependent mobility into account.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlyGa1-yAs; BTT; Gaussian doped base region; HBT; analytical model; base emitter voltage; base transit time estimation; collector current density; electric field dependent carrier mobility; heterojunction bipolar transistor; Current density; Doping; Electric fields; Heterojunction bipolar transistors; Junctions; Shape; Silicon germanium; Base transit time of AlGaAs HBT; Field dependent mobility; Gaussian doping; Graded base;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering (ICECE), 2014 International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4799-4167-4
Type :
conf
DOI :
10.1109/ICECE.2014.7027024
Filename :
7027024
Link To Document :
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