Title :
Thermal Relaxation In Perpendicular Double-layered Media
Author :
Jiang, W.H. ; Muracka, H. ; Sugita, Yosuke ; Nakamura, Yoshihiko
Author_Institution :
RIEC
Keywords :
Anisotropic magnetoresistance; Atomic layer deposition; Crystallization; Magnetic recording; Paramagnetic materials; Perpendicular magnetic recording; Plasma measurements; Rough surfaces; Sputtering; Surface roughness;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742603