DocumentCode :
2515086
Title :
Mobile test systems for flightline and forward battle areas
Author :
Buchholz, Thomas W.
Author_Institution :
Div. of Electron. Systs., Northrop Grumman Corp., Rolling Meadows, IL, USA
fYear :
1994
fDate :
20-22 Sep 1994
Firstpage :
507
Lastpage :
508
Abstract :
Mobile testers are rapidly becoming a critical ingredient in present and future military automatic test equipment strategies and procurements. Lightweight, portable testers are required in flightline, at forward battle areas and in rapid deployment operations. These portable testers must have RF and microwave testing capabilities which until now have not been easily available in small, portable systems. This paper focuses on a systems approach in using digital signal processing (DSP) and monolithic microwave integrated circuits (MMIC) in developing portable testers. Leading edge MMIC technology has enabled RF/microwave systems to be downsized for completely portable flightline and field use. Future defense programs such as Joint Services Electronic Combat System Tester (JSECST) will emphasize this capability
Keywords :
MMIC; automatic test equipment; digital signal processing chips; microwave measurement; military equipment; portable instruments; radio applications; FFT; Joint Services Electronic Combat System Tester; MMIC; RF; RF/microwave systems; VXI; defense programs; digital signal processing; field use; flightline; forward battle areas; microwave testing; military automatic test equipment; mobile test systems; monolithic microwave integrated circuits; portable testers; procurements; rapid deployment operations; Automatic test equipment; Automatic testing; Circuit testing; Digital signal processing; MMICs; Microwave devices; Military equipment; Procurement; Radio frequency; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
Type :
conf
DOI :
10.1109/AUTEST.1994.381576
Filename :
381576
Link To Document :
بازگشت